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Device Characterization Lab

This laboratory is mainly dedicated to perform parametric measurements in semiconductors and passive devices. In this lab it is possible to acquire internal signals from the semiconductors, already cutted and packaged, or from wafers up to 3.5", and performing tests at temperatures ranging from -125ºC to 150ºC.

Chief Lab Technician


Antonio Ragel Morales<  >

Equipment


  • Semiconductor Parameter Analyzers
  • Climatic Chambers
  • Liquid nitrogen
  • Temperature control systems (Intest ATS-505 and ATS-770)
  • TSE-12 Thermal Shock Chamber

Labs & Workshops